TY - GEN
T1 - Survival Analysis for the Evolution of Lifespan of Electrical and Electronic Equipment
T2 - 2025 IEEE Technology and Engineering Management Society Conference, TEMSCON LATAM 2025
AU - Chumpitaz-Flores, Pedro
AU - Gusukuma, Marco
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This research presents a framework for analyzing the life cycle evolution of first use of electronic and electrical devices for the assessment and management of Waste Electrical and Electronic Equipment (WEEE), with a focus on television equipment in Peru as a case study. This analysis is based on data from official entities such as National Institute of Statistics and Informatics (Instituto Nacional de Estadística e Informática or INEI), providing a basis for research. The study begins with the application of non-parametric methods, such as the Kaplan-Meier method, to estimate the lifespan of televisions, followed by an analysis using parametric models that suit the nature of the data, implementing statistical validation techniques to ensure the reliability of the obtained results. The proposed framework highlights retention and management patterns of the electrical devices in the examined context and offers a structure for similar studies in different contexts or regions. By focusing on official data sources, the study proposes a methodology, paving the way for policy formulation for the management of waste from electrical and electronic equipment.
AB - This research presents a framework for analyzing the life cycle evolution of first use of electronic and electrical devices for the assessment and management of Waste Electrical and Electronic Equipment (WEEE), with a focus on television equipment in Peru as a case study. This analysis is based on data from official entities such as National Institute of Statistics and Informatics (Instituto Nacional de Estadística e Informática or INEI), providing a basis for research. The study begins with the application of non-parametric methods, such as the Kaplan-Meier method, to estimate the lifespan of televisions, followed by an analysis using parametric models that suit the nature of the data, implementing statistical validation techniques to ensure the reliability of the obtained results. The proposed framework highlights retention and management patterns of the electrical devices in the examined context and offers a structure for similar studies in different contexts or regions. By focusing on official data sources, the study proposes a methodology, paving the way for policy formulation for the management of waste from electrical and electronic equipment.
KW - Device Durability Analysis
KW - Environmental Management
KW - Lifespan
KW - Official Data Sources
KW - Survival Analysis
UR - https://www.scopus.com/pages/publications/105029820186
U2 - 10.1109/TEMSCONLATAM65810.2025.11238676
DO - 10.1109/TEMSCONLATAM65810.2025.11238676
M3 - Conference contribution
AN - SCOPUS:105029820186
T3 - TEMSCON LATAM 2025 - Technology and Engineering Management Society Conference
BT - TEMSCON LATAM 2025 - Technology and Engineering Management Society Conference
A2 - Mendoza, Paul Sanmartin
A2 - Vilora-Nunez, Cesar
A2 - Ahumanda-Tello, Eduardo
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 18 June 2025 through 20 June 2025
ER -