Resumen
The mechanical properties of ceramics films at the sub-micron, even nanometer length scale have attracted increased attention due to the high-speed development of microelectronic technology. In this work, nano-indentation hardness as a function of the different individual layer thickness has been measured and investigated in the sputtered Al/Si3N4 multilayers with different indenters (Vickers and Brinell). For this ceramics/metal multilayers system, the hardness of the multilayers increases with decreasing individual layer thickness from 500nm to 100nm and from 50nm to 10nm, indicating a significant size effect. At the same time, changes in the deformation behavior may be controlled by different deformation mechanisms for submicron scale and nanometer scale.
| Idioma original | Inglés |
|---|---|
| Páginas (desde-hasta) | 2355-2358 |
| Número de páginas | 4 |
| Publicación | Journal of the European Ceramic Society |
| Volumen | 33 |
| N.º | 12 |
| DOI | |
| Estado | Publicada - oct. 2013 |
| Publicado de forma externa | Sí |
Huella
Profundice en los temas de investigación de 'Nanoindentation of nano-Al/Si3N4 multilayers with Vickers and Brinell indenters'. En conjunto forman una huella única.Citar esto
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