@inproceedings{61a5e58f45054cc7b00165a743ee614a,
title = "Morphologic evaluation of thin films by algorithms of optical phase stepping applied to images obtained by interferential microscopy",
abstract = "The characterization of the superficial topography of a thin film, obtained from an interferometer installed in our Optics Laboratory, is done using bi-dimensional images of its surface overlaid with interference fringes (interferogram1). These images differ among them only by a constant variation of the optical phase2. The total number of images to acquire depends on the image processing algorithm to apply; this algorithm allows to determine the value of the phase introduced by the surface form.",
keywords = "Interference fringes, Interferometer, Optical phase",
author = "Valentin Sarmiento and Miguel Asmad and Choque, {J. Ivan} and Guillermo Baldwin",
year = "2013",
doi = "10.1117/12.2025981",
language = "English",
isbn = "9780819496010",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications",
note = "8th Iberoamerican Optics Meeting, RIAO 2013 and 11th Latin American Meeting on Optics, Lasers, and Applications, OPTILAS 2013 ; Conference date: 22-07-2013 Through 26-07-2013",
}