TY - GEN
T1 - A new morphological measure of histogram bimodality
AU - Cataño, Miguel Angel
AU - Climent, Joan
PY - 2012
Y1 - 2012
N2 - The presence of multiple modes in a histogram gives important information about data distribution for a great amount of different applications. The dip test has been the most common statistical measure used for this purpose. Histograms of oriented gradients (HOGs) with a high bimodality have shown to be very useful to detect highly robust keypoints. However, the dip test presents serious disadvantages when dealing with such histograms. In this paper we describe the drawbacks of the dip test for determining HOGs bimodality, and present a new bimodality test, based on mathematical morphology, that overcomes them.
AB - The presence of multiple modes in a histogram gives important information about data distribution for a great amount of different applications. The dip test has been the most common statistical measure used for this purpose. Histograms of oriented gradients (HOGs) with a high bimodality have shown to be very useful to detect highly robust keypoints. However, the dip test presents serious disadvantages when dealing with such histograms. In this paper we describe the drawbacks of the dip test for determining HOGs bimodality, and present a new bimodality test, based on mathematical morphology, that overcomes them.
KW - Bimodality test
KW - Dynamics
KW - Histograms of Oriented Gradients
KW - Keypoint detection
KW - Mathematical Morphology
UR - http://www.scopus.com/inward/record.url?scp=84865601890&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-33275-3_48
DO - 10.1007/978-3-642-33275-3_48
M3 - Conference contribution
AN - SCOPUS:84865601890
SN - 9783642332746
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 390
EP - 397
BT - Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 17th Iberoamerican Congress, CIARP 2012, Proceedings
T2 - 17th Iberoamerican Congress on Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications, CIARP 2012
Y2 - 3 September 2012 through 6 September 2012
ER -