Publicación

Surface Measurement of Aluminum Thin Films by Using Michelson-Type Interferential Microscopy

Ivan Choque · Miguel Asmad · Josue Miranda · Alberto Quispe

2023 SSRN Electronic Journal DOI: 10.2139/ssrn.4605485 1 vistas

Autores y colaboradores

Authors

Palabras clave

Materials science Aluminium Surface (topology) Microscopy