Segment Anything Model for Scan-to-Structural Analysis in Cultural Heritage

Demitrios Galanakis, Stuardo Lucho, Emmanuel Maravelakis, Nikolaos Bolanakis, Antonios Konstantaras, Nectarios Vidakis, Markos Petousis, Sylvie Treuillet, Xavier Desquesnes, Xavier Brunetaud

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Segment anything model (SAM) proposed by META Artificial Intelligence (AI) has disrupted the space of Deep Learning (DL) and Machine Learning (ML) and claims performance that outrivals conventional Convolutional Neural Networks (CNNs). The well recognized success of foundation models paved the way towards Natural Language Processing (NLP), which in computer vision domain, rests upon the concept of vision transformers (ViT). The claimed scalability and zero-shot predictability of the proposed mode has spurred extensive research among different fields. In this sense, this paper aims to investigate Segment Anything Model (SAM) potential in cultural heritage (CH) inclined scenarios. This is part of an ongoing project that seeks to implement scan-to-structural analysis at stone level. Based on the findings of this research, SAM zero-shot segmentation ability is quite promising for complex scene understanding. In addition, its tendency to favor small objects may provide a unique opportunity for damage detection and defects classification. Finally, even without any pre-training, SAM exhibits remarkable performance in edge detection and masking, without sacrificing generalizability and its accuracy in segmentation correlates to spatial resolution and background separation.

Original languageEnglish
Title of host publicationEEITE 2024 - Proceedings of 2024 5th International Conference in Electronic Engineering, Information Technology and Education
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350372878
DOIs
StatePublished - 2024
Externally publishedYes
Event5th International Conference in Electronic Engineering, Information Technology and Education, EEITE 2024 - Chania, Greece
Duration: 29 May 202431 May 2024

Publication series

NameEEITE 2024 - Proceedings of 2024 5th International Conference in Electronic Engineering, Information Technology and Education

Conference

Conference5th International Conference in Electronic Engineering, Information Technology and Education, EEITE 2024
Country/TerritoryGreece
CityChania
Period29/05/2431/05/24

Keywords

  • cultural heritage
  • FEM
  • Finite Element Modelling
  • HBIM
  • Heritage BIM
  • segment anything model

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