Process decomposition and test selection for distributed fault diagnosis

Elodie Chanthery, Anna Sztyber, Louise Travé-Massuyès, Carlos Gustavo Pérez-Zuñiga

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Decomposing is one way to gain efficiency when dealing with large scale systems. In addition, the breakdown into subsystems may be mandatory to reflect some geographic or confidentiality constraints. In this context, the selection of diagnostic tests must comply with decomposition and it is desired to minimize the number of subsystem interconnections while still guaranteeing maximal diagnosability. On the other hand, it should be noticed that there is often some flexibility in the way to decompose a system. By placing itself in the context of structural analysis, this paper provides a solution to the double overlinked problem of choosing the decomposition of the system by leveraging existing flexibility and of selecting the set of diagnostic tests so as to minimize subsystem interconnections while maximizing diagnosability.

Original languageEnglish
Title of host publicationTrends in Artificial Intelligence Theory and Applications. Artificial Intelligence Practices - 33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020, Proceedings
EditorsHamido Fujita, Jun Sasaki, Philippe Fournier-Viger, Moonis Ali
PublisherSpringer Science and Business Media Deutschland GmbH
Pages914-925
Number of pages12
ISBN (Print)9783030557881
DOIs
StatePublished - 2020
Event33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020 - Kitakyushu, Japan
Duration: 22 Sep 202025 Sep 2020

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume12144 LNAI
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference33rd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2020
Country/TerritoryJapan
CityKitakyushu
Period22/09/2025/09/20

Keywords

  • Diagnosis test selection
  • Structural analysis
  • System decomposition

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