Morphologic evaluation of thin films by algorithms of optical phase stepping applied to images obtained by interferential microscopy

Valentin Sarmiento
, M. Asmad
, J. Ivan Choque
, Guillermo E. Baldwin

Pontificia Universidad Católica del Perú

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 results

Finished

Caracterización y medida morfológica de películas delgadas mediante microscopia inteferencial y técnicas de obtención Digital de la fase óptica.
Asmad Vergara, M. A. (PI), Baldwin Olguin, G. E. (CoI), Luis Manuel, L. M. (CoI), Choque Aquino, J. I. (Other) & Sarmiento Pumarayme, V. J. (Other)
1/01/12 → 1/11/12
Project: Research