Abstract
This work shows characterization methods for laser pointers as whole systems and also for semiconductor lasers. We started developing a current controller and a power light meter designed and calibrated for this type of work. Characteristic curves as optical power output versus forward current and forward current versus forward voltage and also related characteristic parameters as threshold current are obtained. In addition, far field radiation patterns with their angles of divergence, the astigmatic distance are found. It is intended that these devices can be used for optics and optoelectronics education as well as for the development of measurement and communications systems based in semiconductor lasers.
| Original language | Spanish |
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| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Pages | 130-133 |
| Number of pages | 4 |
| Volume | 4419 |
| State | Published - 1 Dec 2001 |