TY - JOUR
T1 - Experimental study of the surface roughness in metals with different surface finishing by two dimensional correlation of speckle pattern
AU - Asmad, Miguel
AU - Baldwin, Guillermo
AU - Maczeyzik, Cordula
AU - Mendoza, Fernando
AU - López, Carlos Pérez
PY - 2005
Y1 - 2005
N2 - In this work we use an experimental set-up implemented in the Optical Physics Laboratory of PUCP, in order to study and to measure the roughness of different surfaces. The surfaces have different finishing obtained in different mechanic process (milling, turning, etc). The measurement method is based on a two-dimensional scan of scattered light from a rough metal surface illuminated by laser light. The light is scattered as speckle pattern and it is captured by the CCD of a digital camera in two different configurations, with and without a imaging lens and under different angles of illumination. Using two-dimensional Fast Fourier Transform it has been possible to compute the angular correlation between speckle pattern images and find out the relationship between surface roughness and speckle patterns decorrelation for different metal surface finishing.
AB - In this work we use an experimental set-up implemented in the Optical Physics Laboratory of PUCP, in order to study and to measure the roughness of different surfaces. The surfaces have different finishing obtained in different mechanic process (milling, turning, etc). The measurement method is based on a two-dimensional scan of scattered light from a rough metal surface illuminated by laser light. The light is scattered as speckle pattern and it is captured by the CCD of a digital camera in two different configurations, with and without a imaging lens and under different angles of illumination. Using two-dimensional Fast Fourier Transform it has been possible to compute the angular correlation between speckle pattern images and find out the relationship between surface roughness and speckle patterns decorrelation for different metal surface finishing.
UR - http://www.scopus.com/inward/record.url?scp=26444504577&partnerID=8YFLogxK
U2 - 10.1117/12.611830
DO - 10.1117/12.611830
M3 - Conference article
AN - SCOPUS:26444504577
SN - 0277-786X
VL - 5776
SP - 530
EP - 537
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
M1 - 95
T2 - Eighth International Symposium on Laser Metrology
Y2 - 14 February 2005 through 18 February 2005
ER -