Defect Detection on Andean Potatoes using Deep Learning and Adaptive Learning

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

Potato is economically important in Peru, which is the first potato producer in Latin America, however, the quality of native potatoes need to be improved to increment their consumption. An automatic classification process to detect potato defects is important within the entire production chain to guarantee the high quality of the product. In the present research, a Convolutional Neural Network is used to detect defects in the Huayro potato surface. This is an Andean potato originally from Peru and is special because it has very marked eyes that can complicate the differentiation from pests that leaves holes in the potato. An adaptive learning was proposed in the work, where the principal idea is to evaluate continuously the learning of the neural network to adapt the training process (in this case the training data) to increment the learning performance. The detection results were around 88.2% of F1 score, providing a good performance of the algorithm.

Original languageEnglish
Title of host publicationProceedings of the 2020 IEEE Engineering International Research Conference, EIRCON 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728183671
DOIs
StatePublished - 21 Oct 2020
Event2020 IEEE Engineering International Research Conference, EIRCON 2020 - Lima, Peru
Duration: 21 Oct 202023 Oct 2020

Publication series

NameProceedings of the 2020 IEEE Engineering International Research Conference, EIRCON 2020

Conference

Conference2020 IEEE Engineering International Research Conference, EIRCON 2020
Country/TerritoryPeru
CityLima
Period21/10/2023/10/20

Keywords

  • Andean potato
  • Deep learning
  • adaptive learning
  • computer vision
  • defect detection

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