TY - GEN
T1 - Automatic classification of physical defects in green coffee beans using CGLCM and SVM
AU - Condori, Rayner H.Montes
AU - Humari, Juan H.Chuctaya
AU - Portugal-Zambrano, Christian E.
AU - Gutiérrez-Cáceres, Juan C.
AU - Beltrán-Castañón, César A.
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/11/21
Y1 - 2014/11/21
N2 - This work is focused on the evaluation of physical coffee beans through a model of automatic classification of defects. The model uses a segmentation step that discriminates the background from the coffee bean image with a follow contours algorithm, then a CGLCM is introduced as features extractor and a Support Vector Machine for the classification task, a database of images has been collected with a total of 3367 images, the classification process used twelve categories of defects, the results of classification showed a accuracy of 86%. Finally a set of conclusions and future works are presented.
AB - This work is focused on the evaluation of physical coffee beans through a model of automatic classification of defects. The model uses a segmentation step that discriminates the background from the coffee bean image with a follow contours algorithm, then a CGLCM is introduced as features extractor and a Support Vector Machine for the classification task, a database of images has been collected with a total of 3367 images, the classification process used twelve categories of defects, the results of classification showed a accuracy of 86%. Finally a set of conclusions and future works are presented.
KW - coffee bean
KW - computer vision
KW - feature extraction
KW - segmentation
UR - http://www.scopus.com/inward/record.url?scp=84919460692&partnerID=8YFLogxK
U2 - 10.1109/CLEI.2014.6965169
DO - 10.1109/CLEI.2014.6965169
M3 - Conference contribution
AN - SCOPUS:84919460692
T3 - Proceedings of the 2014 Latin American Computing Conference, CLEI 2014
BT - Proceedings of the 2014 Latin American Computing Conference, CLEI 2014
A2 - Ezzatti, Pablo
A2 - Delgado, Andrea
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 40th Latin American Computing Conference, CLEI 2014
Y2 - 15 September 2014 through 19 September 2014
ER -